| Page | | Article title | | Author(s) |
|---|
| 1-21 |
|
Soil Burial Tests: Soil Burial of Materials and Structures |
|
Connolly, R.A. |
| 23-42 |
|
Soil Burial Tests: Effect of Soil Burial Exposure on the Properties of Molded Plastics |
|
Miner, R.J. |
| 43-46 |
|
Soil Burial Tests: Effect of Soil Burial Exposure on the Properties of Casting Resins |
|
Ventrice, F.X. |
| 47-49 |
|
Soil Burial Tests: Effect of Soil Burial Exposure on the Properties of Electrical Grade Reinforced Plastic Laminates |
|
Kwei, T.K. |
| 51-62 |
|
Soil Burial Tests: Effect of Soil Burial Exposure on the Properties of Structural Grade Reinforced Plastic Laminates |
|
Klein, T.H. |
| 63-86 |
|
Soil Burial Tests: Effect of Soil Burial Exposure on the Properties of Plastics for Wire and Cable |
|
DeCoste, J.B. |
| 87-121 |
|
Soil Burial Tests: Effect of Soil Burial Exposure on the Properties of Rubber, Crosslinked Polyethylene, and Vulcanized Wire Coatings |
|
Bebbington, G.H. |
| 123-149 |
|
Soil Burial Tests: Effect of Soil Burial Exposure on the Properties of Adhesives and Pressure-Sensitive Tapes |
|
Dahringer, D.W. |
| 151-163 |
|
Soil Burial Tests: Trends in Material Behavior After Eight Years of Soil Exposure |
|
Connolly, R.A. |
| 165-207 |
|
Waiting Time Jitter |
|
Duttweiler, D.L. |
| 209-228 |
|
Coupled Line Equations with Random Coupling |
|
Morrison, J.A.; McKenna, J. |
| 229-237 |
|
Derivation of Coupled Power Equations |
|
Marcuse, D. |
| 239-259 |
|
Buffering of Data Generated by the Coding of Moving Images |
|
Limb, J.O. |
| 261-289 |
|
Buffer and Channel Sharing by Several Interframe Picturephone Coders |
|
Haskell, B.G. |
| 291-300 |
|
Optimal Test Point Selection for Sequential Manufacturing Processes |
|
Garey, M.R. |
| 301-316 |
|
The General Second-Order Twin-T and Its Application to Frequency-Emphasizing Networks |
|
Lueder, E. |
| 317-320 |
|
Contributors to this Issue |
|
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