AMERICAN PHYSICAL SOCIETY
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Physical Review Letters – 31 December 1990 (Volume 65, Issue 27)
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Surface extended-x-ray-absorption fine structure and scanning tunneling microscopy of Si(001)2×1-Sb
M. Richter, J. C. Woicik, J. Nogami, P. Pianetta, K. E. Miyano, A. A. Baski, T. Kendelewicz, C. E. Bouldin, W. E. Spicer, C. F. Quate, and I. Lindau
pp.
3417-3420 [ View
PDF (765 kB)
See Also: Erratum]
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